Open AccessReliability Analysis based on Inverse Gauss Degradation Process and Evidence Theory
Author(s) -
Yuwei Wang,
Feng Hailin
Publication year - 2019
Language(s) - English
DOI - 10.23940/ijpe.19.02.p1.353361
Subject(s) - reliability (semiconductor) , degradation (telecommunications) , reliability engineering , process (computing) , gauss , reliability theory , computer science , inverse , econometrics , mathematics , statistics , engineering , thermodynamics , physics , geometry , telecommunications , power (physics) , quantum mechanics , failure rate , operating system