Open AccessDynamic Time Series Reliability Analysis for Long-Life Mechanic Parts with Stress-Strength Correlated Interference Model
Author(s) -
Bin Suo
Publication year - 2019
Language(s) - English
DOI - 10.23940/ijpe.19.01.p6.5666
Subject(s) - reliability (semiconductor) , series (stratigraphy) , interference (communication) , reliability engineering , stress (linguistics) , dynamic stress , time series , engineering , structural engineering , computer science , statistics , mathematics , finite element method , telecommunications , physics , geology , paleontology , power (physics) , channel (broadcasting) , linguistics , philosophy , quantum mechanics