Open AccessMonitoring of SiC MOSFET junction temperature with on-state voltage at high currents
Author(s) -
Dan Zheng,
Yuhui Kang,
Han Cao,
Xiaoguang Chai,
Tao Fan,
Puqi Ning
Publication year - 2020
Publication title -
chinese journal of electrical engineering
Language(s) - English
Resource type - Journals
ISSN - 2096-1529
DOI - 10.23919/cjee.2020.000014
Subject(s) - junction temperature , mosfet , voltage , materials science , calibration , diode , modulation (music) , optoelectronics , signal (programming language) , electronic engineering , state (computer science) , topology (electrical circuits) , high voltage , electrical engineering , computer science , physics , engineering , transistor , acoustics , thermal , quantum mechanics , algorithm , meteorology , programming language
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