Open AccessFailure analysis of power electronic devices and their applications under extreme conditions
Author(s) -
Yong Luo,
Fei Xiao,
Bo Weng,
Binli Liu
Publication year - 2016
Publication title -
chinese journal of electrical engineering
Language(s) - English
Resource type - Journals
ISSN - 2096-1529
DOI - 10.23919/cjee.2016.7933119
Subject(s) - reliability (semiconductor) , reliability engineering , power (physics) , power electronics , computer science , power semiconductor device , physics of failure , power module , electronics , converters , electrical engineering , engineering , voltage , physics , quantum mechanics