Bifaces in plain sight: testing elliptical Fourier analysis in identifying reduction effects on Late Middle Palaeolithic bifacial tools | Zendy

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Bifaces in plain sight: testing elliptical Fourier analysis in identifying reduction effects on Late Middle Palaeolithic bifacial tools

Author(s) -

Kamil Serwatka

Publication year - 2015

Publication title -

litikum

Language(s) - English

Resource type - Journals

ISSN - 2064-3640

DOI - 10.23898/litikuma0009

Subject(s) - sight , geology , optics , physics

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