Open AccessImpact of Big Data on Inspections for Semiconductors
Author(s) -
Chen H. Hsu
Publication year - 2021
Publication title -
nanomedicine and nanotechnology open access
Language(s) - English
Resource type - Journals
ISSN - 2574-187X
DOI - 10.23880/nnoa-16000211
Subject(s) - semiconductor , materials science , computer science , reliability engineering , engineering , optoelectronics