Open AccessSurface Metrology and Data Science/Analytics Applied to Modern Asian Lacquer Surfaces
Author(s) -
H. David Sheets,
Patrick Ravines,
Marianne Webb
Publication year - 2021
Publication title -
archiving
Language(s) - English
Resource type - Journals
eISSN - 2168-3204
pISSN - 2161-8798
DOI - 10.2352/issn.2168-3204.2021.1.0.16
Subject(s) - lacquer , metrology , analytics , surface (topology) , data science , computer science , nanotechnology , materials science , optics , physics , mathematics , geometry , coating