XRD vs Raman for InGaN/GaN Structures
Author(s) -
Ahmet Kürşat Bılgılı,
Ömer AKPINAR,
Mustafa Kemal Öztürk,
Süleyman Özçelik,
Ekmel Özbay
Publication year - 2019
Publication title -
journal of polytechnic
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2147-9429
pISSN - 1302-0900
DOI - 10.2339/politeknik.537733
Subject(s) - raman spectroscopy , materials science , chemical vapor deposition , metalorganic vapour phase epitaxy , diffraction , atomic force microscopy , analytical chemistry (journal) , homogeneous , crystallography , optoelectronics , nanotechnology , optics , chemistry , epitaxy , layer (electronics) , physics , thermodynamics , chromatography
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