z-logo
open-access-imgOpen Access
XRD vs Raman for InGaN/GaN Structures
Author(s) -
Ahmet Kürşat Bilgili,
Ömer Akpınar,
Mustafa Kemal Öztürk,
Süleyman Özçelik,
Ekmel Özbay
Publication year - 2020
Publication title -
politeknik dergisi
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2147-9429
pISSN - 1302-0900
DOI - 10.2339/politeknik.537733
Subject(s) - raman spectroscopy , materials science , chemical vapor deposition , metalorganic vapour phase epitaxy , diffraction , atomic force microscopy , analytical chemistry (journal) , homogeneous , crystallography , optoelectronics , nanotechnology , optics , chemistry , epitaxy , layer (electronics) , physics , thermodynamics , chromatography

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here