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Testing fit for the grouped exponential distribution
Author(s) -
Spinelli John J.
Publication year - 2001
Publication title -
canadian journal of statistics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.804
H-Index - 51
eISSN - 1708-945X
pISSN - 0319-5724
DOI - 10.2307/3316040
Subject(s) - histogram , statistics , mathematics , exponential function , exponential distribution , goodness of fit , exponential family , von mises distribution , computer science , von mises yield criterion , artificial intelligence , mathematical analysis , engineering , image (mathematics) , structural engineering , finite element method
Grouped data can often arise due to the lack of resolution of the measurement instruments; they also arise when data are deliberately rounded to a certain accuracy and are presented, say, in the form of a histogram. The author uses statistics of the Cramér‐von Mises type to test for the exponential distribution when data are grouped.