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Statistical Analysis of Reliability and Life‐Testing Models: Theory and Methods
Author(s) -
Kimber Alan
Publication year - 1993
Publication title -
journal of the royal statistical society: series c (applied statistics)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.205
H-Index - 72
eISSN - 1467-9876
pISSN - 0035-9254
DOI - 10.2307/2986242
Subject(s) - reliability (semiconductor) , reliability engineering , accelerated life testing , computer science , statistics , engineering , mathematics , physics , thermodynamics , weibull distribution , power (physics)
Statistical Analysis of Reliability and Life‐testing Models: Theory and Methods, 2nd edn (Statistics Textbooks and Monographs, vol. 115). By L. J. Bain and M. Englehardt. ISBN 0 8247 8506 1. Dekker, New York, 1991. viii + 496 pp. $115.00 (USA and Canada), $132.25 (elsewhere).
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