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Bayesian Inference for Masked System Lifetime Data
Author(s) -
Reiser B.,
Guttman I.,
Lin Dennis K. J.,
Guess Frank M.,
Usher John S.
Publication year - 1995
Publication title -
journal of the royal statistical society: series c (applied statistics)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.205
H-Index - 72
eISSN - 1467-9876
pISSN - 0035-9254
DOI - 10.2307/2986196
Subject(s) - inference , bayesian probability , bayesian inference , computer science , econometrics , statistics , environmental science , data mining , artificial intelligence , mathematics
SUMMARY Estimating component and system reliabilities frequently requires using data from the system level. Because of cost and time constraints, however, the exact cause of system failure may be unknown. Instead, it may only be ascertained that the cause of system failure is due to a component in a subset of components. This paper develops methods for analysing such masked data from a Bayesian perspective. This work was motivated by a data set on a system unit of a particular type of IBM PS/2 computer. This data set is discussed and our methods are applied to it.