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Accelerated Life Testing and Experts' Opinion in Reliability
Author(s) -
Phillips M. J.
Publication year - 1990
Publication title -
journal of the royal statistical society: series a (statistics in society)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.103
H-Index - 84
eISSN - 1467-985X
pISSN - 0964-1998
DOI - 10.2307/2983109
Subject(s) - reliability (semiconductor) , accelerated life testing , reliability engineering , psychology , computer science , engineering , developmental psychology , power (physics) , physics , quantum mechanics , maturity (psychological)
8. Accelerated Life Testing and Experts' Opinion in Reliability. Edited by C. A. Clarotti and D. V. Lindley. ISBN 0 444 87101 2. North‐Holland, Amsterdam, 1988. xviii + 236pp. $84.25.
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