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A Bayesian Reliability Growth Model for Computer Software
Author(s) -
Littlewood B.,
Verrall J. L.
Publication year - 1973
Publication title -
journal of the royal statistical society: series c (applied statistics)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.205
H-Index - 72
eISSN - 1467-9876
pISSN - 0035-9254
DOI - 10.2307/2346781
Subject(s) - software quality , computer science , reliability engineering , reliability (semiconductor) , bayesian probability , software , statistics , mathematics , software development , artificial intelligence , engineering , programming language , power (physics) , physics , quantum mechanics
Summary A Bayesian reliability growth model is presented which includes special features designed to reproduce special properties of the growth in reliability of an item of computer software (program). The model treats the situation where the program is sufficiently complete to work for continuous time periods between failures, and gives a repair rule for the action of the programmer at such failures. Analysis is based entirely upon the length of the periods of working between repairs and failures, and does not attempt to take account of the internal structure of the program. Methods of inference about the parameters of the model are discussed.