Open AccessStatistical Processes and Reliability Engineering.
Author(s) -
W. R. Buckland,
D. N. Chorafas
Publication year - 1962
Publication title -
biometrika
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.307
H-Index - 122
eISSN - 1464-3510
pISSN - 0006-3444
DOI - 10.2307/2334007
Subject(s) - mathematics , reliability (semiconductor) , reliability engineering , statistics , engineering , power (physics) , physics , quantum mechanics
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