The methodology for active testing of electronic devices under the radiations | Zendy

Aldo Parlato | Zendy; Elio Angelo Tomarchio | Zendy; Cristiano Calligaro | Zendy; C. Nick Pace | Zendy

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The methodology for active testing of electronic devices under the radiations

Author(s) -

Aldo Parlato,

Elio Angelo Tomarchio,

Cristiano Calligaro,

C. Nick Pace

Publication year - 2018

Publication title -

nuclear technology and radiation protection

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.31

H-Index - 16

eISSN - 1452-8185

pISSN - 1451-3994

DOI - 10.2298/ntrp1801053p

Subject(s) - computer science , set (abstract data type) , ranging , software , electronic component , electronics , reliability engineering , embedded system , computer hardware , electrical engineering , engineering , operating system , programming language , telecommunications

The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for static random access memory modules are reported.

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