Open AccessThe methodology for active testing of electronic devices under the radiations
Author(s) -
Aldo Parlato,
A Elio Tomarchio,
Cristiano Calligaro,
Calogero Pace
Publication year - 2018
Publication title -
nuclear technology and radiation protection
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.31
H-Index - 16
eISSN - 1452-8185
pISSN - 1451-3994
DOI - 10.2298/ntrp1801053p
Subject(s) - computer science , set (abstract data type) , ranging , software , electronic component , electronics , reliability engineering , embedded system , computer hardware , electrical engineering , engineering , operating system , programming language , telecommunications
The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for static random access memory modules are reported.