Open AccessGamma-ray irradiation tests of CMOS sensors used in imaging techniques
Author(s) -
Salvatore G. Cappello,
Calogero Pace,
Aldo Parlato,
Salvatore Rizzo,
Elio Angelo Tomarchio
Publication year - 2014
Publication title -
nuclear technology and radiation protection
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.31
H-Index - 16
eISSN - 1452-8185
pISSN - 1451-3994
DOI - 10.2298/ntrp140ss14c
Subject(s) - irradiation , collimated light , pixel , ionizing radiation , cmos , image sensor , gamma ray , radiation , materials science , noise (video) , absorbed dose , image quality , optoelectronics , optics , nuclear medicine , computer science , physics , artificial intelligence , image (mathematics) , medicine , laser , astrophysics , nuclear physics
Technologically-enhanced electronic image sensors are used in various fields as diagnostic techniques in medicine or space applications. In the latter case the devices can be exposed to intense radiation fluxes over time which may impair the functioning of the same equipment.\udIn this paper we report the results of gamma-ray irradiation tests on CMOS image sensors simulating the space radiation over a long time period.\udGamma-ray irradiation tests were car ried out by means of IGS-3 gamma irradiation facility\udof Palermo Uni ver sity, based on 60Co sources with dif fer ent ac tiv i ties. To re duce the dose rate\udand re al ize a nar row gamma-ray beam, a lead-collimation sys tem was pur posely built. It per -\udmits to have dose rate val ues less than 10 mGy/s and to ir ra di ate CMOS Im age Sen sors dur ing\udop er a tion. The to tal ion iz ing dose to CMOS im age sen sors was mon i tored in-situ, dur ing ir -\udra di a tion, up to 1000 Gy and im ages were ac quired ev ery 25 Gy.\udAt the end of the tests, the sen sors con tin ued to op er ate de spite a back ground noise and some\udpix els were com pletely sat u rated. These ef fects, how ever, in volve iso lated pix els and there -\udfore, should not af fect the im age qual ity