Open AccessTrends in low-voltage embedded-RAM technology
Author(s) -
Kiyoo Itoh
Publication year - 2002
Publication title -
facta universitatis - series electronics and energetics
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2217-5997
pISSN - 0353-3670
DOI - 10.2298/fuee0201001i
Subject(s) - dram , static random access memory , subthreshold conduction , electronic circuit , electrical engineering , low voltage , leakage (economics) , mosfet , voltage , threshold voltage , logic gate , computer science , electronic engineering , transistor , materials science , engineering , computer hardware , economics , macroeconomics
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