Open AccessReliability and Risk Improvement Index and Validation Criteria for Ventricular Assist Device Projects
Author(s) -
Jeferson Cerqueira Dias,
Jônatas Cerqueira Dias,
Rodrigo Lima Stoeterau,
Newton Maruyama,
Paulo Eige Miyagi,
Aron José Pazin de Andrade,
Diolino José dos Santos Filho
Publication year - 2021
Publication title -
journal of engineering research
Language(s) - English
Resource type - Journals
ISSN - 2764-1317
DOI - 10.22533/at.ed.3172115106
Subject(s) - reliability engineering , reliability (semiconductor) , index (typography) , computer science , engineering , power (physics) , physics , quantum mechanics , world wide web
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