Open AccessSEM: Understanding & Optimising Scanning Electon Microscope Performance
Author(s) -
Steve Chapman
Publication year - 2009
Publication title -
infocus magazine
Language(s) - Uncategorized
Resource type - Journals
ISSN - 1750-4740
DOI - 10.22443/rms.inf.1.45
Subject(s) - scanning electron microscope , materials science , microscope , optoelectronics , nanotechnology , optics , composite material , physics