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Panorama de riesgos por el uso de la tecnología en América Latina
Author(s) -
Jhoeen Sneyder Rojas-Díaz,
John Jairo Yepes-Londoño
Publication year - 2022
Publication title -
trilogía ciencia tecnología sociedad
Language(s) - Spanish
Resource type - Journals
eISSN - 2145-7778
pISSN - 2145-4426
DOI - 10.22430/21457778.2020
Subject(s) - humanities , art

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