
On Bayesian Shrinkage Setup for Item Failure Data Under a Family of Life Testing Distribution
Author(s) -
Gyan Prakash
Publication year - 2010
Publication title -
journal of modern applied statistical methods
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.169
H-Index - 28
ISSN - 1538-9472
DOI - 10.22237/jmasm/1288585260
Subject(s) - mathematics , bayes' theorem , statistics , shrinkage estimator , shrinkage , prior probability , estimator , bayesian probability , failure rate , reliability (semiconductor) , hazard , probability density function , econometrics , efficient estimator , minimum variance unbiased estimator , power (physics) , physics , chemistry , organic chemistry , quantum mechanics