Open AccessFake Reviews Detection Using Supervised Machine Learning
Author(s) -
Nikhil Chandra Sai Ram,
Gowtham Vakati,
Jagadesh Varma Nadimpall,
Yash Sah,
Sai Karthik Datla
Publication year - 2022
Publication title -
international journal for research in applied science and engineering technology
Language(s) - Uncategorized
Resource type - Journals
ISSN - 2321-9653
DOI - 10.22214/ijraset.2022.43202
Subject(s) - reputation , computer science , naive bayes classifier , machine learning , artificial intelligence , key (lock) , process (computing) , logistic regression , support vector machine , computer security , social science , sociology , operating system