Open Access
Verification of Dual Port RAM using System Verilog and UVM: A Review
Publication year - 2021
Publication title -
international journal for research in applied science and engineering technology
Language(s) - English
Resource type - Journals
ISSN - 2321-9653
DOI - 10.22214/ijraset.2021.33473
Subject(s) - verilog , computer science , dual (grammatical number) , port (circuit theory) , embedded system , computer hardware , field programmable gate array , engineering , electrical engineering , art , literature