Open AccessParametric Optimization of EDM of EN-40 for MRR, TWR and White Layer Thickness
Author(s) -
Saleem Khan
Publication year - 2019
Publication title -
international journal for research in applied science and engineering technology
Language(s) - English
Resource type - Journals
ISSN - 2321-9653
DOI - 10.22214/ijraset.2019.5375
Subject(s) - materials science , parametric statistics , layer (electronics) , composite material , white (mutation) , mathematics , chemistry , biochemistry , statistics , gene