
The Influence of Emotional valence and Cognitive Effort on False Memory in DRM paradigm
Author(s) -
Youngshin Park,
Chai-Youn Kim
Publication year - 2011
Publication title -
hanguk simni hakoeji. inji mit saengmul/han'gug simri haghoeji
Language(s) - English
Resource type - Journals
eISSN - 2733-466X
pISSN - 1226-9654
DOI - 10.22172/cogbio.2011.23.4.008
Subject(s) - emotional valence , psychology , cognitive psychology , cognition , valence (chemistry) , false memory , neuroscience , physics , quantum mechanics