
Определение толщины поляризованной области стекла
Author(s) -
А.И. Дергачев,
В.В. Журихина,
А.А. Липовский
Publication year - 2021
Publication title -
pisʹma v žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-7471
pISSN - 0320-0116
DOI - 10.21883/pjtf.2021.05.50670.18614
Subject(s) - scanning electron microscope , materials science , scattering , electron , optics , energy (signal processing) , physics , composite material , quantum mechanics
It is shown that the scattering of electrons near the interface between the poled and unpoled regions of glass makes it possible to determine the thickness of the poled region from the image obtained by a scanning electron microscope. Good agreement between the thicknesses determined from the SEM images and by energy dispersive analysis was demonstrated.