Open AccessВремяпролетная оптическая диагностика мощных импульсных ионных пучков
Author(s) -
В.А. Рыжков,
Б.А. Нечаев,
В.Н. Падалко
Publication year - 2020
Publication title -
pisʹma v žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-7471
pISSN - 0320-0116
DOI - 10.21883/pjtf.2020.07.49222.18097
Subject(s) - fluence , ablation , materials science , ion , plasma , hydrogen ion , hydrogen , layer (electronics) , analytical chemistry (journal) , atomic physics , radiochemistry , chemistry , nuclear physics , physics , nanotechnology , chromatography , organic chemistry , engineering , aerospace engineering
Ablation of a thin surface contamination layer is used to control fluencies of intense pulsed ion beams. The layer is self-restored after each ion pulse. An optical time-of-flight spectrometer measures velocities of the lightest components of the ablation plasma, hydrogen and carbon, to determine the ion fluence.