Open AccessВлияние времени нарастания напряжения на переходные процессы при токовой перегрузке в стабилизированных ВТСП-проводах второго поколения
Author(s) -
В.А. Мальгинов
Publication year - 2019
Publication title -
pisʹma v žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-7471
pISSN - 0320-0116
DOI - 10.21883/pjtf.2019.22.48640.17822
Subject(s) - resistive touchscreen , current (fluid) , materials science , refrigerant , stabilizer (aeronautics) , voltage , reliability (semiconductor) , current limiting , copper , composite material , electrical engineering , thermodynamics , metallurgy , physics , engineering , mechanical engineering , power (physics) , gas compressor
The effect of spontaneous reverse transition of the stable HTSC tape from the normal to the resistive state with rapid input voltage and current overload at alternating current is detected. For the first time it is established that during the occurrence of this effect and at the thickness of the stabilizer above 13 µm, the main heat releases occur in the copper stabilizer and are effectively discharged into the refrigerant, which significantly reduces the heating of the HTSC layer. In this case, the resistance of the secondary resistive state decreases and the time of its existence increases. These data make it possible to use the detected effect to increase the time of current limitation and reliability of HTSC current limiters.