Open AccessВнутрирезонаторная волноводная спектроскопия тонких пленок
Author(s) -
А. В. Шульга,
А. В. Хомченко,
И. В. Шилова
Publication year - 2018
Publication title -
pisʹma v žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-7471
pISSN - 0320-0116
DOI - 10.21883/pjtf.2018.21.46849.17418
Subject(s) - transverse plane , materials science , optics , spectroscopy , waveguide , laser , optoelectronics , longitudinal mode , physics , engineering , structural engineering , quantum mechanics
AbstractThe method of intracavity waveguide spectroscopy for measuring low optical losses in thin films is proposed. The method also allows one to distinguish transverse and longitudinal modes in low-gain lasers without introducing considerable losses into the cavity.