Open AccessЭлектрические и магнитные свойства ультратонких поликристаллических пленок Fe, выращенных на SiO-=SUB=-2-=/SUB=-/Si(001)
Author(s) -
В. В. Балашев,
K. S. Ermakov,
L. A. Chebotkevich,
В. В. Коробцов
Publication year - 2018
Publication title -
pisʹma v žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-7471
pISSN - 0320-0116
DOI - 10.21883/pjtf.2018.13.46332.17304
Subject(s) - crystallite , materials science , hysteresis , electrical resistivity and conductivity , substrate (aquarium) , range (aeronautics) , silicon , condensed matter physics , analytical chemistry (journal) , composite material , mineralogy , metallurgy , chemistry , electrical engineering , geology , oceanography , physics , engineering , chromatography
Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of ~6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.