Open AccessЭкситонные линии поглощения PbS в композите CdS-PbS
Author(s) -
N. B. Trofimova,
А. Г. Роках,
А. О. Бочкарев,
M. I. Shishkin
Publication year - 2018
Publication title -
pisʹma v žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-7471
pISSN - 0320-0116
DOI - 10.21883/pjtf.2018.07.45888.17011
Subject(s) - exciton , absorption edge , materials science , semiconductor , optoelectronics , infrared window , absorption (acoustics) , band gap , photodetector , reflection (computer programming) , infrared , optics , condensed matter physics , physics , computer science , composite material , programming language
The spectral dependences of transmission, absorption, and reflection in CdS−PbS semiconductor layers, which are promising for the development of photodetectors and emitters in the region of an atmospheric- transparency window, were studied. It has been established that a series of thin lines are observed in the infrared spectrum on an absorption edge of the narrow-gap phase (PbS). A method for identification of exciton series was used, and exciton-binding energy E _ ex , exciton concentration N , and value of valence-band splitting Δ E _ v were determined.