
Исследование диэлектрических функций слоя наночастиц Ag на кремнии с помощью спектроэллипсометрии и спектрофотометрии
Author(s) -
В.А. Толмачев,
Ю.А. Жарова,
А.А. Ермина,
В.О. Большаков
Publication year - 2022
Publication title -
optika i spektroskopiâ
Language(s) - English
Resource type - Journals
eISSN - 2782-6694
pISSN - 0030-4034
DOI - 10.21883/os.2022.02.51992.2668-21
Subject(s) - dielectric , dielectric function , materials science , plasmon , drude model , surface plasmon , ellipsometry , tilt (camera) , range (aeronautics) , analytical chemistry (journal) , crystal (programming language) , optics , molecular physics , thin film , chemistry , optoelectronics , physics , nanotechnology , mechanical engineering , engineering , chromatography , computer science , composite material , programming language
An investigation of the optical characteristics of a layer of Ag nanoparticles deposited from an AgNO3 solution on the surface of single-crystal Si is presented. The measurements were carried out using spectroscopic ellipsometry and spectrophotometry at the same tilt angle and sample probe location in a wide spectral range from 200 to 1700 nm. From the obtained experimental data, the parameters of the Drude-Lorentz model and the complex dielectric function were determined, which was compared with the pseudo-dielectric function. Both dependences revealed resonances of a bulk plasmon near the energy E = 3.8 eV, while a localized plasmon was detected in the pseudo-dielectric function at E = 1.65 eV, and in the dielectric function at E = 1.84 eV.