Open AccessСхема VLS-монохроматора высокого разрешения для синхротронного излучения
Author(s) -
А.Н. Шатохин,
Е.А. Вишняков,
А.О. Колесников,
А.Д. Николенко,
Е.Н. Рагозин
Publication year - 2021
Publication title -
žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-748X
pISSN - 0044-4642
DOI - 10.21883/jtf.2021.10.51369.86-21
Subject(s) - monochromator , optics , grating , physics , ray tracing (physics) , spectral resolution , beamline , synchrotron radiation , blazed grating , x ray optics , range (aeronautics) , wavelength , diffraction grating , spectral line , materials science , x ray , beam (structure) , astronomy , composite material
A high-resolution monochromator with a broad spectral range of 125 – 4200 Angstrem is designed for the measuring beamline for the projected synchrotron radiation source "SKIF" (Novosibirsk). The optical configuration of the monochromator comprises a grazing-incidence concave mirror, a plane VLS grating, and an exit slit. It is planned to use two replaceable VLS gratings with central line frequencies of 600 mm-1 and 150 mm-1 intended for subranges of 125 – 1000 Angstrem and 900 – 4200 Angstrem , respectively. Wavelength tuning in each of the two subranges is effected by only the rotation of the VLS-gratings. Due to the proper choice of p_1 VLS-grating coefficients, the focal distance varies only slightly over the entire spectral range, and the p_2 VLS-grating coefficients are used to suppress the aberrations of the mirror and the gratings. The resolving power of the configuration obtained by numerical ray tracing exceeds 1000 in the 125 – 1000 Angstrem range and 2000 in the 900 – 4200 Angstrem range.