
Зондовая микроскопия и электронно-транспортные свойства тонких эпитаксиальных пленок Mo на сапфире
Author(s) -
Л. А. Фомин,
И. В. Маликов,
В. А. Березин,
А. В. Черных,
А. Б. Логинов,
Б. А. Логинов
Publication year - 2020
Publication title -
žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-748X
pISSN - 0044-4642
DOI - 10.21883/jtf.2020.11.49970.110-20
Subject(s) - molybdenum , materials science , epitaxy , thin film , composite material , nanotechnology , metallurgy , layer (electronics)
The surface and electronic transport properties of epitaxial thin molybdenum films were studied. The experimental results were compared with the known quantum models of the effect of the surface relief of the films on their resistance.