Open AccessДиагностика пучков заряженных частиц методом фазовых диаграмм
Author(s) -
В.В. Лукашевич
Publication year - 2020
Publication title -
žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-748X
pISSN - 0044-4642
DOI - 10.21883/jtf.2020.03.48934.90-19
Subject(s) - optics , nonlinear system , physics , nonlinear optics , phase (matter) , aperture (computer memory) , beam (structure) , acoustics , quantum mechanics
To determine the quality of focusing of charged particles in ion-optical devices, it is proposed to use the method of phase diagrams. Phase diagrams with nonlinear contours indicate the nonlinearity of the focusing of the particle beam, and the aperture value is clearly observed, at which nonlinearity appears and increases. This opens up the possibility of designing linear focusing lenses or aberration correctors that compensate the nonlinearity of optics.