Open AccessПрименение сканирующей емкостной силовой микроскопии для выявления примесных фаз в сегнетоэлектрике триглицинсульфат
Author(s) -
Р.В. Гайнутдинов,
А.Л. Толстихина,
А.К. Лашкова,
Н.В. Белугина,
В.Н. Шут,
С.Е. Мозжаров,
И.Ф. Кашевич
Publication year - 2019
Publication title -
žurnal tehničeskoj fiziki
Language(s) - English
Resource type - Journals
eISSN - 1726-748X
pISSN - 0044-4642
DOI - 10.21883/jtf.2019.11.48330.119-19
Subject(s) - triglycine sulfate , impurity , ferroelectricity , capacitance , materials science , capacitive sensing , crystal (programming language) , optics , piezoelectricity , analytical chemistry (journal) , condensed matter physics , chemistry , optoelectronics , physics , composite material , electrode , dielectric , organic chemistry , chromatography , computer science , programming language , operating system
The results of the study of inhomogeneous ferroelectric triglycine sulfate single crystal with a growth periodic impurity structure TGS - TGS + Cr are presented. The impurity distribution was investigated with scanning capacitance force microscopy (SCFM). The peculiarities of the capacitance variations imaging on a doubled and tripled resonant frequency of electrostatic force are considered. The piezoelectric response, surface potential and surface topography were studied. It is shown that capacitive contrast is formed both at the domain boundaries and in the TGS and TGS + Cr bands. It was shown that SCFM allowed one to observe the impurity spatial distribution in the ferroelectric structure at the difference in the chromium concentration about 0.02-0.08 wt%.