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Влияние построчного лазерного сканирования на свойства лазерно-индуцированного графена
Author(s) -
К.Г. Михеев,
Р.Г. Зонов,
А.В. Сюгаев,
Д.Л. Булатов,
Г.М. Михеев
Publication year - 2022
Publication title -
fizika tverdogo tela
Language(s) - English
Resource type - Journals
eISSN - 1726-7498
pISSN - 0367-3294
DOI - 10.21883/ftt.2022.05.52341.277
Subject(s) - raman spectroscopy , scanning electron microscope , x ray photoelectron spectroscopy , materials science , polyimide , graphene , carbonization , laser , laser scanning , carbon fibers , optoelectronics , nanotechnology , chemical engineering , optics , composite material , layer (electronics) , physics , composite number , engineering
Technology of polyimide (PI) film carbonization by direct laser treatment attracts much attention due to the versatility and ease of obtaining the carbon material, laser-induced graphene (LIG), used in the creation of various sensors and functional devices. In this work LIG film structures are obtained by line-by-line scanning of a continuous CO2 laser beam over the surface of the PI film. The synthesized carbon film material is studied by optical and scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. It is shown that the Raman spectra of a single LIG line and a set of overlapping LIG lines significantly differ from each other. It is found that multiple laser scanning of the PI film leads to a marked decrease in the number of defects in the LIG structure as well as to a significant decrease in the specific surface resistance of the synthesized film material. The results obtained can be used in the synthesis of LIG film structures with improved characteristics.

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