Open AccessОсобенности состава и морфологии пленок Cd-=SUB=-x-=/SUB=-Pb-=SUB=-1-x-=/SUB=-S, сформированных на различных подложках
Author(s) -
Л.Н. Маскаева,
В.Ф. Марков,
А.В. Поздин,
В.И. Воронин,
М.В. Кузнецов,
О.А. Липина
Publication year - 2020
Publication title -
fizika tverdogo tela
Language(s) - English
Resource type - Journals
eISSN - 1726-7498
pISSN - 0367-3294
DOI - 10.21883/ftt.2020.12.50220.154
Subject(s) - materials science , amorphous solid , x ray photoelectron spectroscopy , impurity , substrate (aquarium) , phase (matter) , silicon , diffraction , x ray crystallography , analytical chemistry (journal) , solid solution , crystal structure , crystal (programming language) , deposition (geology) , crystallography , chemical engineering , optics , chemistry , metallurgy , paleontology , programming language , oceanography , physics , organic chemistry , chromatography , sediment , computer science , engineering , biology , geology
Chemical deposition of the films consisting of CdxPb1−xS substitutional solid solutions with a cubic B1 structure was carried out from aqueous solutions on the substrates made of single-crystal silicon, sitall, conductive ITO coating and glass. Comparative analysis of films deposited on the various substrates has revealed a number of features associated with their morphology, grain size, elemental and phase composition. It was suggested to describe the diffraction reflection profiles using three- or two-phase models, taking into account the diffuse scattering background from an amorphous material or excluding reflections from the crystalline substrate material in order to increase the quantitative assessment of the structural parameters of CdxPb1−xS films obtained on various substrates. X-ray diffraction, XPS and optical studies have shown that the synthesized films contain, in addition to the CdxPb1−xS phase, impurity wide-gap compounds: Pb(OH)2, Pb(OH)(СН3СОО) and CdS.