Open AccessО возможности изготовления мостиков YBCO с совершенной поверхностью, критической температурой более 88 K и плотностью критического тока до 5·10-=SUP=-6-=/SUP=- A/cm-=SUP=-2-=/SUP=-
Author(s) -
Д. В. Мастеров,
С.А. Павлов,
А. Е. Парафин,
Е. В. Скороходов
Publication year - 2020
Publication title -
fizika tverdogo tela
Language(s) - English
Resource type - Journals
eISSN - 1726-7498
pISSN - 0367-3294
DOI - 10.21883/ftt.2020.09.49760.10h
Subject(s) - morphology (biology) , materials science , critical current , fabrication , topology (electrical circuits) , layer (electronics) , deposition (geology) , current density , nanotechnology , condensed matter physics , superconductivity , physics , mathematics , combinatorics , medicine , paleontology , genetics , alternative medicine , pathology , quantum mechanics , sediment , biology
In the fabrication of YBCO structures by traditional methods, as a rule, some compromise is reached, namely, films with acceptable morphology are used, but with reduced electrophysical parameters. In this paper, it is shown that YBCO bridges up to 4 microns wide with perfect surface morphology, i.e. free from defects, with a critical current density Jc ≥ 3106 A/cm2 at a temperature T = 77 K and a critical temperature Tс ≥ 88 K. can be obtained using the preliminary topology mask method. Moreover, the perfect morphology of the bridge surface, the values of the critical current density and the critical temperature are preserved even after repeated (additional) deposition of the YBCO layer on the structure with the preliminary topology mask. Based on the results obtained in a series of fifteen samples, it is concluded that, in contrast to the electrophysical characteristics, it is not enough to fix the standard (basic) parameters of the growth process for the stable implementation of the perfect surface morphology of YBCO films.