
Влияние скин-эффекта и активных потерь на интенсивность линий ЭПР в полупроводящих веществах
Author(s) -
А.М. Зюзин,
А.А. Карпеев,
Н.В. Янцен
Publication year - 2020
Publication title -
fizika tverdogo tela
Language(s) - English
Resource type - Journals
eISSN - 1726-7498
pISSN - 0367-3294
DOI - 10.21883/ftt.2020.02.48875.590
Subject(s) - conductivity , intensity (physics) , materials science , volume (thermodynamics) , absorption (acoustics) , electrical resistivity and conductivity , electron paramagnetic resonance , analytical chemistry (journal) , line (geometry) , optics , composite material , nuclear magnetic resonance , chemistry , thermodynamics , mathematics , physics , chromatography , geometry , quantum mechanics
The influence of the skin effect and active losses in samples of a semiconducting composite with a wide range of conductivity values on the intensity of the EPR absorption line was studied. An approach is proposed that makes it possible to obtain a satisfactory agreement between the calculated and experimental results. It is shown that, depending on the conductivity of the test substance, absorption line intensity, corresponding to a unit volume, can decrease significantly with increasing sample volume.