Open AccessПроводимость манганитных пленок под действием напряженности, вызванной деформацией подложки
Author(s) -
Г.А. Овсянников,
Т.А. Шайхулов,
В.А. Шахунов,
A. A. Klimov,
В.Л. Преображенский,
Nicolas Tiercelin,
Philippe Pernod
Publication year - 2019
Publication title -
fizika tverdogo tela
Language(s) - English
Resource type - Journals
eISSN - 1726-7498
pISSN - 0367-3294
DOI - 10.21883/ftt.2019.09.48115.08n
Subject(s) - piezoelectricity , materials science , ferroelectricity , curie temperature , epitaxy , manganite , thin film , polarization (electrochemistry) , substrate (aquarium) , pulsed laser deposition , laser ablation , dielectric , condensed matter physics , composite material , laser , optics , optoelectronics , chemistry , nanotechnology , ferromagnetism , physics , oceanography , layer (electronics) , geology
The results of study of the electron transport properties of La0.7Ba0.3MnO3 (LBMO) strained manganite epitaxial thin films are presented. The films with thickness of 40–100 nm were made using laser ablation at a temperature of T = 700–800 ° C in an at-mosphere of pure oxygen of 0.3–1 mBar. To create a strain, we used ferroelectric sub-strates (011) 0.79PbMg1/3Nb2/3O3-0.21PbTiO3 (PMN-PT) with Curie temperature of 150 C and with high piezoelectric constants. By applying voltage to the PMN-PT substrate, the effect of the ferroelectric polarization and the piezoelectric stress on the electric parameters of the LBMO films was investigated.