
Воздействие поля зонда магнитно-силового микроскопа на скирмионное состояние в модифицированной пленке Co/Pt с перпендикулярной анизотропией
Author(s) -
В.Л. Миронов,
Р.В. Горев,
О.Л. Ермолаева,
Н.С. Гусев,
Ю.В. Петров
Publication year - 2019
Publication title -
fizika tverdogo tela
Language(s) - English
Resource type - Journals
eISSN - 1726-7498
pISSN - 0367-3294
DOI - 10.21883/ftt.2019.09.48104.07n
Subject(s) - magnetic force microscope , magnetization , condensed matter physics , magnetic field , materials science , magnetic anisotropy , perpendicular , anisotropy , microscope , focused ion beam , physics , ion , optics , geometry , mathematics , quantum mechanics
We present the experimental magnetization reversal of artificial magnetic skyrmions in a Co/Pt multilayer film with perpendicular magnetization by a magnetic force microscope probe. The sample was a Co/Pt film containing an array of cylindrical regions with reduced anisotropy, which were modified by a focused He+ ion beam. The magnetic state of the sample was monitored by magnetic force microscopy. The local magnetization reversal was performed by the field of magnetic force microscope probe passing over the sample at low height. The effects of magnetostatic interaction between the probe field and skyrmion magnetization in these structures are investigated by micromagnetic simulations.