Open AccessВлияние кристаллической структуры на электрические свойства тонкопленочных PZT структур
Author(s) -
L. A. Delimova,
Е. В. Гущина,
Н. В. Зайцева,
Д. С. Серегин,
К. А. Воротилов,
А. С. Сигов
Publication year - 2018
Publication title -
fizika tverdogo tela
Language(s) - English
Resource type - Journals
eISSN - 1726-7498
pISSN - 0367-3294
DOI - 10.21883/ftt.2018.03.45560.269
Subject(s) - materials science , perovskite (structure) , texture (cosmology) , lead zirconate titanate , crystallization , conductivity , deposition (geology) , percolation (cognitive psychology) , composite material , mineralogy , analytical chemistry (journal) , ferroelectricity , chemical engineering , dielectric , optoelectronics , chemistry , chromatography , computer science , paleontology , artificial intelligence , sediment , biology , neuroscience , engineering , image (mathematics)
A new method of two-stage crystallization of lead zirconate–titanate (PZT) films using a seed sublayer with a low excess lead content has been proposed and realized. A seed layer with a strong texture of perovskite Pe(111) grains is formed from a solution with a lead excess of 0–5 wt %; the fast growth of the grains is provided by the deposition of the main film from a solution with high lead content. As a result, a strong Pe(111) texture with complete suppression of the Pe(100) orientation forms. An analysis of current–voltage dependences of the transient currents and the distributions of the local conductivity measured by the contact AFM method reveals two various mechanisms of current percolation that are determined by traps in the bulk and at the perovskite grain interfaces.