Аномальная зависимость интенсивности рентгеновских рефлексов Cs-=SUB=-2-=/SUB=-SO-=SUB=-4-=/SUB=- от размера и формы кристаллитов | Zendy

И.М. Шмытько | Zendy; В.В. Кедров | Zendy; А.С. Аронин | Zendy

Open Access

Аномальная зависимость интенсивности рентгеновских рефлексов Cs-=SUB=-2-=/SUB=-SO-=SUB=-4-=/SUB=- от размера и формы кристаллитов

Author(s) -

И.М. Шмытько,

В.В. Кедров,

А.С. Аронин

Publication year - 2018

Publication title -

физика твердого тела

Language(s) - English

Resource type - Journals

eISSN - 1726-7498

pISSN - 0367-3294

DOI - 10.21883/ftt.2018.02.45397.240

Subject(s) - crystallite , diffraction , sphericity , materials science , intensity (physics) , texture (cosmology) , crystallography , electron microscope , optics , x ray crystallography , microscopy , scanning electron microscope , chemistry , physics , composite material , image (mathematics) , computer science , artificial intelligence

Detailed X-ray and electron microscopy analyses of Cs_2SO_4 powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed ( hkl ) reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample.

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