Open AccessАномальная зависимость интенсивности рентгеновских рефлексов Cs-=SUB=-2-=/SUB=-SO-=SUB=-4-=/SUB=- от размера и формы кристаллитов
Author(s) -
И.М. Шмытько,
В.В. Кедров,
А.С. Аронин
Publication year - 2018
Publication title -
fizika tverdogo tela
Language(s) - English
Resource type - Journals
eISSN - 1726-7498
pISSN - 0367-3294
DOI - 10.21883/ftt.2018.02.45397.240
Subject(s) - crystallite , diffraction , sphericity , materials science , intensity (physics) , texture (cosmology) , crystallography , electron microscope , optics , x ray crystallography , microscopy , scanning electron microscope , chemistry , physics , composite material , image (mathematics) , computer science , artificial intelligence
Detailed X-ray and electron microscopy analyses of Cs_2SO_4 powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed ( hkl ) reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample.