Open AccessУстановка по измерению термоэлектрических свойств ультратонких проволок
Author(s) -
О.Н. Урюпин,
А.А. Шабалдин
Publication year - 2019
Publication title -
fizika i tehnika poluprovodnikov
Language(s) - English
Resource type - Journals
eISSN - 1726-7315
pISSN - 0015-3222
DOI - 10.21883/ftp.2019.05.47567.25
Subject(s) - materials science , thermoelectric effect , semiconductor , measure (data warehouse) , seebeck coefficient , dielectric , atmospheric temperature range , optoelectronics , range (aeronautics) , nanowire , engineering physics , composite material , thermal conductivity , thermodynamics , physics , computer science , database
An experimental setup is developed to measure the thermoelectric properties of semiconductor nanowires with diameters of up to 5 nm in dielectric matrices. This setup makes it possible to measure the electrical resistance and thermoelectric power of nanostructured samples in the temperature range of 77–400 K.