Установка по измерению термоэлектрических свойств ультратонких проволок | Zendy

О.Н. Урюпин | Zendy; А.А. Шабалдин | Zendy

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Установка по измерению термоэлектрических свойств ультратонких проволок

Author(s) -

О.Н. Урюпин,

А.А. Шабалдин

Publication year - 2019

Publication title -

физика и техника полупроводников

Language(s) - English

Resource type - Journals

eISSN - 1726-7315

pISSN - 0015-3222

DOI - 10.21883/ftp.2019.05.47567.25

Subject(s) - materials science , thermoelectric effect , semiconductor , measure (data warehouse) , seebeck coefficient , dielectric , atmospheric temperature range , optoelectronics , range (aeronautics) , nanowire , engineering physics , composite material , thermal conductivity , thermodynamics , physics , computer science , database

An experimental setup is developed to measure the thermoelectric properties of semiconductor nanowires with diameters of up to 5 nm in dielectric matrices. This setup makes it possible to measure the electrical resistance and thermoelectric power of nanostructured samples in the temperature range of 77–400 K.

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