Open AccessИзлучательная рекомбинация, захват носителей заряда на ловушки и релаксация фототока в PbSnTe : In с составом вблизи инверсии зон
Author(s) -
Д.В. Ищенко,
И.Г. Неизвестный
Publication year - 2018
Publication title -
fizika i tehnika poluprovodnikov
Language(s) - English
Resource type - Journals
eISSN - 1726-7315
pISSN - 0015-3222
DOI - 10.21883/ftp.2018.07.46036.8614
Subject(s) - photocurrent , relaxation (psychology) , photosensitivity , materials science , photoconductivity , semiconductor , photodetector , optoelectronics , electron , fermi level , condensed matter physics , atomic physics , physics , nuclear physics , psychology , social psychology
Based on the notions that PbSnTe:In is a direct-gap semiconductor, the radiative-recombination lifetime is calculated, and the photocurrent relaxation and dependences of the instantaneous electron and hole lifetime are calculated under the assumption that PbSnTe:In is a disordered structure containing capture centers. These calculations explain such experimentally observed peculiarities of PbSnTe:In as a high photosensitivity in a wide wavelength range, pinning of the Fermi level, and long-term photocurrent relaxation. Calculations are also compared with experimental data and the possible parameters of photodetectors are evaluated.