Open AccessИзучение сверхструктуры в сильно легированном пористом фосфиде индия рентгеновскими методами
Author(s) -
М.Е. Бойко,
М.Д. Шарков,
Л.Б. Карлина,
А.М. Бойко,
С.Г. Конников
Publication year - 2018
Publication title -
fizika i tehnika poluprovodnikov
Language(s) - English
Resource type - Journals
eISSN - 1726-7315
pISSN - 0015-3222
DOI - 10.21883/ftp.2018.01.45324.8628
Subject(s) - small angle x ray scattering , diffraction , superstructure , scattering , materials science , isotropy , crystallography , optics , physics , chemistry , thermodynamics
AbstractAn indium-phosphide InP sample subjected to the pore-generation procedure and then doped with S atoms is studied by the methods of X-ray diffraction analysis (XRD) and small-angle X-ray scattering (SAXS) (with Cu K _α1-radiation). The XRD data demonstrate that the sample consists of (coherent) aligned homogeneous components. A point detector is used to obtain, in the anomalous transmission mode by Borrmann, a set of SAXS curves at sample positions varied by azimuthal rotations. The SAXS data are used to simulate a 2D SAXS pattern for the sample under study, which makes it possible to determine the long-distance translation symmetry and, consequently, the presence of a superstructure. The interplanar distances in the superstructure in the directions (110) and (1 0) of the InP lattice are found to be ~260 and 450 nm, respectively. The symmetry group of the superstructure is determined as C _2 v in the (001) plane of the sample lattice.