Open AccessStructural Features of Sm-=SUB=-1-x-=/SUB=-Eu-=SUB=-x-=/SUB=-S Thin Polycrystalline Films
Author(s) -
В. В. Каминский,
С. М. Соловьев,
G. D. Khavrov,
Н. В. Шаренкова,
Shinji Hirai
Publication year - 2017
Publication title -
fizika i tehnika poluprovodnikov
Language(s) - English
Resource type - Journals
eISSN - 1726-7315
pISSN - 0015-3222
DOI - 10.21883/ftp.2017.06.44569.8409
Subject(s) - crystallite , samarium , thin film , valence (chemistry) , lattice constant , scattering , materials science , analytical chemistry (journal) , ion , lattice (music) , condensed matter physics , crystallography , chemistry , diffraction , optics , metallurgy , nanotechnology , physics , inorganic chemistry , organic chemistry , chromatography , acoustics
Thin polycrystalline Sm 1-x Eu x S films (x=0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of x-ray coherent scattering regions was studied. It is shown that formation of Sm 1-x Eu x S films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions. DOI: 10.21883/FTP.2017.06.44569.8409