Open AccessInvestigating the Effect of Electromagnetic Protection on the Reliability and Maintenance Expenses of Tier 1 and 2 Data Centers
Author(s) -
Mahdi khanmohammad,
mohammad Mahdi danaei,
Morteza Kazerooni,
Mohammad Ebrahim Haji Abadi
Publication year - 2018
Publication title -
international journal of engineering and technology
Language(s) - English
Resource type - Journals
eISSN - 2319-8613
pISSN - 0975-4024
DOI - 10.21817/ijet/2018/v10i4/181004207
Subject(s) - reliability (semiconductor) , reliability engineering , business , computer science , engineering , physics , power (physics) , quantum mechanics