Open AccessEnhanced Functionality for Materials Analysis in the DTEM
Author(s) -
Nigel D. Browning,
W. A. Schoeder,
John C. H. Spence
Publication year - 2009
Language(s) - English
Resource type - Reports
DOI - 10.2172/977140
Subject(s) - picosecond , laser , interrogation , temporal resolution , ultrashort pulse , ultrafast electron diffraction , synchrotron radiation , electron , synchrotron , characterization (materials science) , instrumentation (computer programming) , electron diffraction , materials science , optics , diffraction , chemistry , nanotechnology , physics , computer science , operating system , quantum mechanics , archaeology , history
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